Principle and application of low energy inverse photoemissionspectroscopy : A new method for measuring unoccupied statesof organic semiconductors

ヨシダ, ヒロユキ

Information about the unoccupied states is crucial to both fundamental and applied physics of organicsemiconductors. However, there were no available experimental methods that meet the requirement ofsuch research. In this review, we describe a new experimental method to examine the unoccupied states,called low-energy inverse photoemission spectroscopy (LEIPS). An electron having the kinetic energylower than the damage threshold of organic molecules is introduced to a sample film, and an emittedphoton in the near-ultraviolet range is detected with high resolution and sensitivity. Unlike the previ-ous inverse photoemission spectroscopy, the sample damage is negligible and the overall resolution is afactor of two improved to 0.25 eV. Using LEIPS, electron affinity of organic semiconductor can be deter-mined with the same precision as photoemission spectroscopy for ionization energy. The instrumentsincluding an electron source and photon detectors as well as application to organic semiconductors arepresented.

https://opac.ll.chiba-u.jp/da/curator/100081/

https://opac.ll.chiba-u.jp/da/curator/100081/PrincipleandApplicationofLowEnergy.pdf

Elsevier

Journal Article

AA00697082

Journal of Electron Spectroscopy and Related Phenomena

204

116

124

2015-07-13

https://doi.org/10.1016/j.elspec.2015.07.003

eng

http://dx.doi.org/10.1016/j.elspec.2015.07.003

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