High-energy-resolution angle-resolved inverse-photoelectron spectroscopy apparatus for damage-free measurements of conduction band structures of functional materials

[Abstract] The energy band structure of the conduction band (energy-momentum relation of electrons) is crucial to understanding the electron transport of crystalline materials. In this paper, we describe an angle-resolved low-energy inverse photoelectron spectroscopy (AR-LEIPS) apparatus that examines the conduction band structures of materials sensitive to the electron beam, such as organic semiconductors and organic-inorganic hybrid perovskites. The principle of this apparatus is based on angle-resolved inverse photoelectron spectroscopy. To minimize radiation damage and improve energy resolution, we employed our previous approach used in low-energy inverse photoelectron spectroscopy [Yoshida, Chem. Phys. Lett. 539–540, 180 (2012)]. We obtained the overall energy resolution of 0.23 eV with the momentum resolution of 0.9 nm-1 at the electron kinetic energy of 2 eV or higher.

https://opac.ll.chiba-u.jp/da/curator/900121756/

https://opac.ll.chiba-u.jp/da/curator/900121756/RSI22-AR-02604.pdf

AIP Publishing

学術雑誌論文

Review of Scientific Instruments

94

6

063903

2023-06-09

10.1063/5.0138204

author

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments 94, 063903 (2023) and may be found at https://doi.org/10.1063/5.0138204 .